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On goodness of fit testing of exponenttality using the memoryless property 

Author: Ibrahim Alwasel a
Affiliation:   a Department of Statistics and Operations Research, King Saud University, Riyadh, Saudi Arabia
DOI: 10.1080/10485250108832865
Publication Frequency: 8 issues per year
Published in: journal Journal of Nonparametric Statistics, Volume 13, Issue 4 2001 , pages 569 - 581
Formats available: PDF (English)
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Abstract

In this paper a test of fit for exponentiality based on the memoryless property is proposed. This procedure is applicable whether the scale and or the location parameters of the distribution are known or not The limiting behavior of the proposed test statistic is obtained and is shown to be normal under minimal conditions for both the null and null null distributions. The use of the proposed test is shown in an illustrative example. Also, empirical power of the test is evaluated for some commonly used alternatives using Monte Carlo methods. This shows that the test performs well compared to other procedures in the literature.
Keywords: Goodness of fit testing; Limiting distribution; Power of tests; Asymptotic normality; Monte Carlo methods
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