Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials
Authors:
H. H. Tian a;
M. Atzmon ab
| Affiliations: | a Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA |
| b Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan, USA |
DOI:
10.1080/01418619908210391
Number of References: 29
Formats available:
PDF
(English)
Now published as: Philosophical Magazine
The circumstances under which this title is published have changed:
Reason for change: Merged
Date of change: 2003
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Abstract
The Warren-Averbach (WA) analysis of X-ray Bragg-peak broadening, as well as simplified methods, are employed in the characterization of a set of nanocrystalline Fe powder samples with a wide range of grain sizes. In the WA analysis, the hook effect present at short times is attributed to small-angle grain boundaries. A universal relationship between grain size and rms strain is observed for all samples. For subtraction of instrumental peak broadening, a parabolic relation is found to yield the closest approximation to iterative convolution. Among the integral breadth methods, assuming that both strain and grain size broadening result in a Cauchy peak shape yields the largest grain size and smallest strain. Assuming that both contributions result in Gaussian peaks does the opposite, providing the closest approximation of the WA volume-averaged grain size. The Scherrer equation shows fortuitous agreement with the WA area-averaged grain size. The simplified methods can lead to severe systematic errors when the peak shape varies between samples.
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