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Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials 

Authors: H. H. Tian a; M. Atzmon ab
Affiliations:   a Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA
b Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan, USA
DOI: 10.1080/01418619908210391
Published in: journal Philosophical Magazine A, Volume 79, Issue 8 August 1999 , pages 1769 - 1786
Number of References: 29
Formats available: PDF (English)
Now published as: Philosophical Magazine

The circumstances under which this title is published have changed:

Reason for change: Merged
Date of change: 2003

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Abstract

The Warren-Averbach (WA) analysis of X-ray Bragg-peak broadening, as well as simplified methods, are employed in the characterization of a set of nanocrystalline Fe powder samples with a wide range of grain sizes. In the WA analysis, the hook effect present at short times is attributed to small-angle grain boundaries. A universal relationship between grain size and rms strain is observed for all samples. For subtraction of instrumental peak broadening, a parabolic relation is found to yield the closest approximation to iterative convolution. Among the integral breadth methods, assuming that both strain and grain size broadening result in a Cauchy peak shape yields the largest grain size and smallest strain. Assuming that both contributions result in Gaussian peaks does the opposite, providing the closest approximation of the WA volume-averaged grain size. The Scherrer equation shows fortuitous agreement with the WA area-averaged grain size. The simplified methods can lead to severe systematic errors when the peak shape varies between samples.
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