Accelerated life testing of an item under more severe than normal conditions is commonly used by industrial statisticians to reduce test time and costs. We consider, from the Bayesian point of view, the problem of accelerated iife tests when the parameter of interest is estimated via the orthogonal prameters (Cox and Reid, 1987) and a type II censoring mechanism for exponential survival data. One important advantage of this orthogonality is to obtain a closed form for the posterior distribution and its mode under the Jeffrey's prior for the parameters involved in the model. The method is illustrated by an example