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About this Journal

Authors: Michael Drmota ^a; Guy Louchard ^b; Nickolay M. Yanev ^c

Affiliations:	^a Institute of Discrete Mathematics and Geometry, Technical University of Vienna, Vienna, Austria
	^b Dpartement d'Informatique, Universit Libre de Bruxelles, Bruxelles, Belgium
	^c Institute of Mathematics and Informatics, Bulgarian Academy of Sciences, Sofia, Bulgaria

DOI: 10.1080/07362990500397426

Publication Frequency: 6 issues per year

Published in: journal

Stochastic Analysis and Applications, Volume 24, Issue 1 March 2006 , pages 37 - 59

Subjects: Statistics & Probability; Stochastic Models & Processes;

Formats available: HTML (English) : PDF (English)

Article Requests: Order Reprints : Request Permissions

31 results ordered by relevance

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	Charts giving confidence intervals for ρ and critical values for r , 978-0-415-08458-1
	Critical values for the Kruskal-Wallis test (equal sample sizes) , 978-0-415-08458-1
	Critical values for the Mann-Whitney U test , 978-0-415-08458-1
	Critical values for the Kruskal-Wallis test (small sample sizes) , 978-0-415-08458-1
	Critical values for Spearman's rank correlation coefficient , 978-0-415-08458-1
	Charts giving confidence intervals for p and critical values for the sample fraction , 978-0-415-08458-1
	Critical values for the Kolmogorov-Smirnov test for normality , 978-0-415-08458-1
	Critical values for the Kolmogorov-mirnov two-sample test , 978-0-415-08458-1
	Critical values for the sign test , 978-0-415-08458-1
	Critical values for the Kolmogorov-Smirnov goodness-of-fit test (for completely specified distributions) , 978-0-415-08458-1