Detector systems introduce distortions into acquired data. To obtain accurate angle and intensity information, it is necessary to calibrate, and apply corrections. Intensity non-linearity, spatial distortion, and non-uniformity of intensity response, are the primary considerations.

It is better to account for the distortions within scientific analysis software, but often it is more practical to correct the distortions to produce 'idealised' data.

Calibration methods and software have been developed for single crystal diffraction experiments, using both approaches. For powder diffraction experiments the additional task of converting a two-dimensional image to a one-dimensional spectrum is used to allow Rietveld analysis. This task may be combined with distortion correction to produce intensity information and error estimates.

High-pressure experiments can introduce additional complications and place new demands on software. Flexibility is needed to be able to integrate different angular regions separately, and to produce profiles as a function of angle of azimuth. Methods to cope with awkward data are described, and examples of the techniques applied to data from high pressure experiments are presented.