Interstitial trapping by Ga or Si atoms in electron-irradiated aluminium
Authors:
O. Dimitrov a;
F. Maury b;
C. Dimitrov a;
A. Lucasson c;
P. Lucasson b;
P. Vajda b
| Affiliations: | a Centre ď Etudes de Chimie M tallurgique, Urbain, Vitry-sur-Seine, France |
b “D fauts dans les M taux.” Equipe de Recherche Associ e au Centre National de la Recherche Scientifique Universit Paris XI, Orsay, France |
|
c Laboratoire de Physique de l'Ecole Normale Sup rieure de Jeunes Filles, Montrouge, France |
DOI:
10.1080/00337578108225725
Publication Frequency:
12 issues per year
Published in:
Radiation Effects and Defects in Solids,
Volume
55,
Issue
3 &
4
June
1981
, pages 177
- 185
Subjects:
Atomic & Nuclear Physics;
Condensed Matter Physics;
Materials Science;
Metals & Alloys;
Semiconductors;
Space Science;
Formats available:
PDF
(English)
View Article:
View Article (PDF)
Abstract
The recovery of electron-irradiated pure aluminium and dilute Al(Ga) and Al(Si) alloys has been studied by means of electrical resistivity measurements and isochronal anneals between 28 and 58 K. The data have been fitted to computed curves in order to obtain the capture radii of mobile self-interstitials by self-interstitials (ri/rυ = 1.6 + 0.2), by gallium atoms (rGa/rυ = 0.5 ± 0.1) and by silicon atoms (rSi/r. = 0.6 + 0.1), relative to the capture radius by a vacancy rυ. The correlations between the capture radii of solutes and the volume dilatation of the lattice-cell or the electronic perturbation they produce are discussed.
|
| view references (28) |

Download Citation


tallurgique, Urbain, Vitry-sur-Seine, France
CiteULike
Del.icio.us
BibSonomy
Connotea