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Interstitial trapping by Ga or Si atoms in electron-irradiated aluminium 

Authors: O. Dimitrov a;  F. Maury b;  C. Dimitrov a;  A. Lucasson c;  P. Lucasson b; P. Vajda b
Affiliations:   a Centre ď Etudes de Chimie Meacutetallurgique, Urbain, Vitry-sur-Seine, France
b “Deacutefauts dans les Meacutetaux.” Equipe de Recherche Associeacutee au Centre National de la Recherche Scientifique Universiteacute Paris XI, Orsay, France
c Laboratoire de Physique de l'Ecole Normale Supeacuterieure de Jeunes Filles, Montrouge, France
DOI: 10.1080/00337578108225725
Publication Frequency: 12 issues per year
Published in: journal Radiation Effects and Defects in Solids, Volume 55, Issue 3 & 4 June 1981 , pages 177 - 185
Formats available: PDF (English)
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Abstract

The recovery of electron-irradiated pure aluminium and dilute Al(Ga) and Al(Si) alloys has been studied by means of electrical resistivity measurements and isochronal anneals between 28 and 58 K. The data have been fitted to computed curves in order to obtain the capture radii of mobile self-interstitials by self-interstitials (ri/rυ = 1.6 + 0.2), by gallium atoms (rGa/rυ = 0.5 ± 0.1) and by silicon atoms (rSi/r. = 0.6 + 0.1), relative to the capture radius by a vacancy rυ. The correlations between the capture radii of solutes and the volume dilatation of the lattice-cell or the electronic perturbation they produce are discussed.
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