Kritische werte f
den X-test von van der waerden
Authors:
Gerhard Kayser a;
Peter Neumann a;
Rainer Salmen a
| Affiliation: | a Technische Universit t, Dresden |
DOI:
10.1080/02331887208801095
Publication Frequency:
6 issues per year
Subjects:
Mathematical Statistics;
Statistical Theory & Methods;
Statistics;
Statistics for the Biological Sciences;
Stochastic Models & Processes;
Formats available:
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Abstract
The X test proposed by VAN DER WAERDEN is a nonpararnetric procedure for testing whether two independently drawn samples result from the same population VAN DER WAERDEN and NIEVERGELT have also given a table of critical values of this X test, but it is too smail for some practical purposes. I n the present pape.the table has been enlarged and checked thereat. Here the critical values are calculated by a new asymptotic formula. developed in the paper. Generally the accuracy of the so obtained approximative values is better than the former used ones.
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