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Kritische werte fuuml den X-test von van der waerden 

Authors: Gerhard Kayser a;  Peter Neumann a; Rainer Salmen a
Affiliation:   a Technische Universitaumlt, Dresden
DOI: 10.1080/02331887208801095
Publication Frequency: 6 issues per year
Published in: journal Statistics, Volume 3, Issue 5 1972 , pages 389 - 400
Formats available: PDF (English)
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Abstract

The X test proposed by VAN DER WAERDEN is a nonpararnetric procedure for testing whether two independently drawn samples result from the same population VAN DER WAERDEN and NIEVERGELT have also given a table of critical values of this X test, but it is too smail for some practical purposes. I n the present pape.the table has been enlarged and checked thereat. Here the critical values are calculated by a new asymptotic formula. developed in the paper. Generally the accuracy of the so obtained approximative values is better than the former used ones.
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