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Quality Engineering, Volume 15 Issue 4 2003

An official journal of the American Society for Quality
ISSN: 1532-4222 (electronic) 0898-2112 (paper)
Publication Frequency: 4 issues per year
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AUTHOR INDEX

Pages 693 – 695
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SUBJECT INDEX

Pages 697 – 700
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Miscellany
Quality's Place On The Fireline
Guest Editorial
Pages 9 – 11
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Original Articles
A Group of Moving Averages Control Plan for Signaling Varying Location Shifts
Ross S. Sparks
Pages 519 – 532
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Recognition and Importance of Restrictions on Randomization in Industrial Experimentation
Doug Sanders; Jim Coleman
Pages 533 – 543
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Adapting EWMA Control Charts for Batch-Correlated Data
Stephen M. Scariano; Jaimie L. Hebert
Pages 545 – 556
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Minimum Cost 100% Inspection Systems with Inspection Error
John Maleyeff;  Frank C. Kaminsky; John P. Farris
Pages 557 – 563
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The Virtual Integrated Design Method
Stan Aungst;  Russell Barton; David Wilson
Pages 565 – 579
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Response Surface Designed Experiment for Door Closing Effort
Robert E. Chapman; Kathleen Masinda
Pages 581 – 585
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Statistical Control of a Six Sigma Process
T. N. Goh; M. Xie
Pages 587 – 592
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A Software Tool for Reliability Estimation
Rashpal S. Ahluwalia
Pages 593 – 608
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A Computer Program To Calculate Two-stage Short-run Control Chart Factors For (�,v) And (�,√v) Charts
Matthew E. Elam; Kenneth E. Case
Pages 609 – 638
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Multivariate Control Chart for Process Dispersion Based on Individual Observations
Michael B. C. Khoo; S. H. Quah
Pages 639 – 642
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Bootstrap Confidence Limits for Short-Run Capability Indices
S. Balamurali
Pages 643 – 648
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A Framework for Reliability Prediction During Product Development Process Incorporating Engineering Judgments
Om Prakash Yadav;  Nanua Singh;  Parveen S. Goel; Rachel Itabashi-Campbell
Pages 649 – 662
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Application of Analysis of Means (ANOM) to Nested Designs for Improving the Visualization and Understanding of the Sources of Variation of Chemical and Pharmaceutical Processes
Mario Gonzalez-de la Parra; Pilar Rodriguez-Loaiza
Pages 663 – 670
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Incorporating Runs Rules into Hotelling's χ2 Control Charts
Michael B. C. Khoo; S. H. Quah
Pages 671 – 675
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A Note on the Lower-Sided Synthetic Chart for Exponentials
Stephen M. Scariano; Maria E. Calzada
Pages 677 – 680
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Standards Column
John E. West
Pages 681 – 685
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A Method For Identifying Which Tolerance Causes Malfunction In Assembled Products
QUALITY QUANDARIES
Søren Bisgaard; Poul Thyregod
Pages 687 – 692
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