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IIE Transactions
, Volume
39
Issue 3 2007
From the Institute of Industrial Engineers
Free Access to Highly-Cited Articles!
ISSN:
1545-8830 (electronic) 0740-817X (paper)
Publication Frequency:
12 issues per year
Subjects:
Integrated Manufacturing Systems
;
Logistics
;
Manufacturing Engineering
;
Manufacturing Engineering Design
;
Operations Management
;
Operations Research
;
Production Systems
;
Quality Control & Reliability
;
Reliability & Risk Analysis
;
Supply Chain Management
;
Publisher:
Taylor & Francis
Issue Purchase: US$98.27 -
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ORIGINAL ARTICLES
A statistical process control approach to business activity monitoring
Wei Jiang; Tom Au; Kwok-Leung Tsui
Pages 235 – 249
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Pattern matching for variation-source identification in manufacturing processes in the presence of unstructured noise
Zhiguo Li; Shiyu Zhou; Yu Ding
Pages 251 – 263
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Element substitution algorithm for general two-terminal network reliability analyses
Bethel A. Gebre; Jose E. Ramirez-Marquez
Pages 265 – 275
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Homogeneous redundancy optimization in multi-state series-parallel systems: A heuristic approach
Manju Agarwal; Rashika Gupta
Pages 277 – 289
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Variable EWMA run-to-run controller for drifted processes
Sheng-Tsaing Tseng; Fugee Tsung; Pei-Yun Liu
Pages 291 – 301
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Failure event prediction using the Cox proportional hazard model driven by frequent failure signatures
Zhiguo Li; Shiyu Zhou; Suresh Choubey; Crispian Sievenpiper
Pages 303 – 315
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A distribution-free tabular CUSUM chart for autocorrelated data
Seong-Hee Kim; Christos Alexopoulos; Kwok-Leung Tsui; James R. Wilson
Pages 317 – 330
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BOOK REVIEWS
A Review of: “Reliability Engineering: Probabilistic Models and Maintenance Methods”
Joel Nachlas Taylor & Francis, 2005, ISBN 0-8493-3598-1
Paolo Silva
Page 331
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A Review of: “Six Sigma for Growth: Driving Profitable Top-Line Results”
Edward Abramowich John Wiley & Sons, 2005, 278 pages, ISBN 0-470-82133-7
Rosa Oppenheim
Pages 332 – 333
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A Review of: “Statistics for Microarrays: Design, Analysis and Inference”
Ernst Wit and John McClure John Wiley & Sons Ltd, Chichester, UK, 2004; xii + 265 pp., ISBN 0-470-84993-2
Mee Young Park
Pages 333 – 334
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