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Original Articles
Yield prediction via spatial modeling of clustered defect counts across a wafer map
Suk Joo Bae;  Jung Yoon Hwang; Way Kuo
Pages 1073 – 1083
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Integrated reconfiguration and age-based preventive maintenance decision making
Jing Zhou;  Dragan Djurdjanovic;  Julie Ivy; Jun Ni
Pages 1085 – 1102
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Determining the number of operational modes in baseline multivariate SPC data
Hang Zhang; Susan Albin
Pages 1103 – 1110
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Maintenance scheduling for a manufacturing system of machines with adjustable throughput
Zimin Yang;  Dragan Djurdjanovic; Jun Ni
Pages 1111 – 1125
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Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts
Argon Chen; Y. K. Chen
Pages 1127 – 1141
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