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IIE Transactions, Volume 40 Issue 2 2008

ISSN: 1545-8830 (electronic) 0740-817X (paper)
Publication Frequency: 12 issues per year
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ORIGINAL ARTICLES
A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication
Tao Yuan; Way Kuo
Pages 93 – 101
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Optimal specifications for degrading characteristics
V. Roshan Joseph; I-Tang Yu
Pages 102 – 108
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Variability monitoring of multistage manufacturing processes using regression adjustment methods
Li Zeng; Shiyu Zhou
Pages 109 – 121
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Holistic reliability analysis of weighted voting systems from a multi-state perspective
Jose Emmanuel Ramirez-Marquez
Pages 122 – 132
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An economic comparison of CUSUM and Shewhart charts
George Nenes; George Tagaras
Pages 133 – 146
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Simultaneous optimization of � control chart and age-based preventive maintenance policies under an economic objective
Thomas G. Yeung;  C. Richard Cassady; Kellie Schneider
Pages 147 – 159
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BOOK REVIEW
Probability and Random Processes
John Wiley & Sons, Inc., Hoboken, N.J., 2006, ISBN 0-471-70354-0, 707 pp.

V. Krishnan; S. Lakshmivarahan
Page 160
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