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Integrated Ferroelectrics
An International Journal
, Volume
98
Issue 1 2008
ISSN:
1607-8489 (electronic) 1058-4587 (paper)
Publication Frequency:
9 issues per year
Subjects:
Chemical Physics
;
Materials Science
;
Publisher:
Taylor & Francis
Issue Purchase: US$1001.98 -
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Editorials
GUEST EDITORIAL
Mario Maglione
Pages vii – ix
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SESSION E2: FeRAM Materials (PZT, SBT, BLT, BiFeO
3
, etc.)
THIN FILMS OF UNDOPED LEAD TITANATE: MORPHOLOGY AND ELECTRICAL PROPERTIES
Ann-Christin Dippel; Theodor Schneller; Rainer Waser
Pages 3 – 10
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EFFECT OF BISMUTH EXCESS ON THE CRYSTALLIZATION OF Bi
3.25
La
0.75
Ti
3
O
12
CERAMIC AND THIN FILM
Wu Yunyi; Yu Jun; Zhang Duanming; Zheng Chaodan; Yang Bin; Wang Yunbo
Pages 11 – 25
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IN SITU
INVESTIGATION OF RETENTION PROPERTIES OF POLYDOMAIN FERROELECTRIC THIN FILMS BY MULTIMODE SCANNING FORCE MICROSCOPY
Longhai Wang; Jun Yu; Zhihong Wang; Huizhong Zeng; Yunbo Wang; Junxiong Gao
Pages 26 – 34
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THE THICKNESS EFFECT OF BTO IN BTO/BLTZ0.20/BTO THIN FILMS PREPARED BY RF-MAGNETRON SPUTTERING
Wu Yunyi; Yu Jun; Zhang Duanming; Zheng Chaodan; Yang Bin; Wang Yunbo
Pages 35 – 45
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FABRICATION AND ELECTRICAL CHARACTERISTICS OF A METAL-FERROELECTRIC-POLYSILICON-INSULATOR-Si FIELD EFFECT TRANSISTOR
Daolin Cai; Ping Li; Yahong Zhai; Jingsong Liu; Shuren Zhang; Yangfan Ou; Yanyu Chen; Dongshen Wu
Pages 46 – 52
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MICROWAVE CHARACTERIZATION OF THIN FERROELECTRIC FILMS WITHOUT ELECTRODES BY COMPOSITE DIELECTRIC RESONATOR
V. Bovtun; S. Veljko; A. Axelsson; S. Kamba; N. Alford; J. Petzelt
Pages 53 – 61
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FATIGUE-FREE MULTIFERROIC Sc-DOPED BiFeO
3
THIN FILMS PROCESSED BY A CHEMICAL SOLUTION DEPOSITION METHOD
A. Huang; S. R. Shannigrahi
Pages 62 – 68
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STRUCTURE AND FERROELECTRIC PROPERTIES OF PZT THIN FILM DEPOSITED ON LaNiO
3
BOTTOM ELECTRODES
Chengtao Yang; Shuren Zhang; Hongwei Zhang; Jinsong Liu
Pages 69 – 76
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THE FERROELECTRIC, DIELECTRIC AND PIEZOELECTRIC PROPERTIES OF W-DOPED SrBi
4
Ti
4
O
15
Juan Sun; Can Jin; Xiao-Bing Chen
Pages 77 – 82
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FREQUENCY-DEPENDENT POLARIZATION IN BiFeO
3
THIN FILMS
S. K. Singh; K. Maruyama; H. Ishiwara
Pages 83 – 89
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INTERFACE STUDIES AND ELECTRONIC PROPERTIES OF SILICON BASED Nd-DOPED BISMUTH TITANATE
Yongyuan Zang; Dan Xie; Yehui Xiao; Yong Ruan; Tianling Ren; Litian Liu
Pages 90 – 96
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MICROSTRUCTURE AND DIELECTRIC PROPERTIES OF ND-DOPED BISMUTH TITANATE
Yongyuan Zang; Dan Xie; Yehui Xiao; Yong Ruan; Tianling Ren; Litian Liu
Pages 97 – 104
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DEGRADATION AND RECOVERY OF POLARIZATION UNDER γ RAYS IN Bi
3.15
Nd
0.85
Ti
3
O
12
FERROELECTRIC CAPACITORS
Tian-zhi Liu; Zhi-gang Zhang; Dan Xie; Yaoqi Dong; Tian-ling Ren; Li-tian Liu; Jun Zhu
Pages 105 – 112
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THE EFFECT OF REDUCED GATE LEAKAGE ON IMPROVED RETENTION TIME OF METAL-FERROELECTRIC (PbZr
0.53
Ti
0.47
O
3
)-INSULATOR (ZrO
2
)-SEMICONDUCTOR CAPACITORS
Wen-chieh Shih; Joseph Ya-min Lee
Pages 113 – 120
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CHARACTERIZATION OF METAL-FERROELECTRIC-SEMICONDUCTOR STRUCTURE USING FERROELECTRIC POLYMER POLYVINYLIDENE FLUORIDE-TRIFLUOROETHYLENE (PVDF-TrFE) (51/49)
Dong-Won Kim; Jeong-Hwan Kim; Joo-Nam Kim; Hyung-Jin Park; Ho-Seung Jeon; Byung-Eun Park
Pages 121 – 127
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OPTICAL CHARACTERIZATION OF Sr
1-x
Ba
x
Bi
4
Ti
4
O
15
GRADED THIN FILMS
Dan Xie; YongYuan Zang; Tianling Ren; Litian Liu
Pages 128 – 135
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ELECTRON BACKSCATTER DIFFRACTION AND PIEZORESPONSE FORCE MICROSCOPY STUDY OF BULK AND THIN FILM PZT SAMPLES
M. J. Lowe; T. Hegarty; K. Mingard; J. Li; M. G. Cain
Pages 136 – 143
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SESSION F2: MEMs, NEMs, PYROELECTRIC/IR, (OPTOELECTRONIC MATERIALS)
NOVEL SLAB-COUPLED LiNbO
3
WAVEGUIDE FOR NONLINEAR OPTICAL APPLICATIONS
Yalin Lu; R. J. Knize
Pages 147 – 155
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