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IIE Transactions, Volume 41 Issue 9 2009

SPECIAL ISSUE ON MULTISTAGE SYSTEMS

From the Institute of Industrial Engineers
Free Access to Highly-Cited Articles!
ISSN: 1545-8830 (electronic) 0740-817X (paper)
Publication Frequency: 12 issues per year
Previously published as: A I I E Transactions (0569-5554) until 1982
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Miscellany
Foreword
Jye-Chyi Lu;  Jianjun Shi;  Kwok-Leung Tsui; Shiyu Zhou
Page 743
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Original Articles
Quality control and improvement for multistage systems: A survey
Jianjun Shi; Shiyu Zhou
Pages 744 – 753
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A Bayesian parallel site methodology with an application to uniformity modeling in semiconductor manufacturing
Joel S. Fenner;  Young-Seon Jeong;  Myong K. Jeong; Jye-Chyi Lu
Pages 754 – 763
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Variance component analysis based fault diagnosis of multi-layer overlay lithography processes
Jie Yu; S. Joe Qin
Pages 764 – 775
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A context tree method for multistage fault detection and isolation with applications to commercial video broadcasting systems
Pierre Brice; Wei Jiang
Pages 776 – 789
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A chart allocation strategy for multistage processes
Ming Jin; Fugee Tsung
Pages 790 – 803
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Optimal sensor distribution in multi-station assembly processes for maximal variance detection capability
Yuan Ren; Yu Ding
Pages 804 – 818
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Sensor system reliability modeling and analysis for fault diagnosis in multistage manufacturing processes
Qingyu Yang; Yong Chen
Pages 819 – 830
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Improving product quality by multiple inspections: Prior and posterior planning of serial inspection procedures
Young H. Chun
Pages 831 – 842
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Optimal fixture locator adjustment strategies for multi-station assembly processes
Thavanrath Chaipradabgiat;  Jionghua Jin; Jianjun Shi
Pages 843 – 852
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