Editor-in-Chief:
Bill Hardgrave - RFID Research Center, University of Arkansas, Fayetteville, AR 72701, USA
Dursun Delen - Oklahoma State University, USA
Jean-Pierre Emond - University of Florida, USA
Bonghee Hong - Pusan National University, South Korea
Antonio Rizzi - University of Parma, Italy
Dieter Uckelmann - University of Bremen, Germany
Editorial Board:
Gisele Bennett - Georgia Institute of Technology, USA
Harold Boeck - Sherbrooke University, Canada
Marcello Braglia - University of Pisa, Italy
Shing-Chi Cheung - Hong Kong University of Science and Technology, China
Q. Chung - Villanova University, USA
Gianluigi Ferrari - University of Parma, Italy
Nelson E. King - American University of Beirut, Lebanon
Alfredo Lambiase - University of Salerno, Italy
Robert Miller - Ashland University, USA
Farhad Moeeni - Arkansas State University, USA
Roberto Montanari - University of Parma, Italy
Fred Riggins - Arizona State University, USA
Bernd Scholz-Reiter - University of Bremen, Germany
Klaus-Dieter Thoben - University of Bremen, Germany
Dale Thompson - University of Arkansas, USA
Junfang Zeng - Chinese Academy of Science, China